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汉语拼音：jīng tǐ guǎn tè xìng tú shì yí

显示晶体管特性曲线和特性曲线族的仪器。由扫描系统、阶梯波系统和显示系统组成。可显示二极管、三极管和场效应管的低频动态特性，包括反向击穿特性。

• This paper describes the design of the transistor curve tracers used technology, which is focused on single chip solution for support.

  本文说明了晶体管特性图示仪的设计所用的技术，该技术是集中于单片机对于解决方案的支持。

• Design of a Simple Transistor Characteristics Display

  简易晶体管特性图示仪设计

• Evaluation of Uncertainty for Verification Apparatus of Calibrator for Transistor Specificity Oscilloscope

  晶体管特性图示仪校准仪检定装置的不确定度评定

• Design of novel scanning signal generation circuit for transistor characteristic exhibit instrument

  新型晶体管特性图示仪扫描信号发生器电路设计

• Transistor Characteristic Exhibit Instrument Based on Single Chip Computer

  基于单片机的晶体管特性图示仪